Radiation detector resolution over a continuous energy range

Summary, in English

An ion approach is demonstrated to determine energy resolution in both semiconductor detectors and scintillators over a continuous energy range. For semiconductors, the energy resolution of a silicon detector was measured as a function of helium ion energy, and the values from extrapolation to high energies are in good agreement with the literature data from alpha measurements. For scintillators, benchmark crystals subject to He+ irradiation were investigated, and the agreement of energy resolution between the ion and gamma measurements indicates that the ion approach can be used to predict the energy resolution of the candidate materials in thin-film form or small crystals when large crystals necessary for gamma-ray measurements are unavailable.

• Author: Yanwen Zhang; Brian D. Milbrath; William J. Weber; Mikael Elfman; Harry J Whitlow
• Department/s: Nuclear physics
• Publishing year: 2007
• Language: English
• Publication/Series: Applied Physics Letters
• Volume: 91
• Issue: 9
• Links: http://dx.doi.org/10.1063/1.2776978
• Document type: Journal article
• Publisher: American Institute of Physics (AIP)
• Topic: Subatomic Physics
• Status: Published
• ISBN/ISSN/Other: ISSN: 0003-6951