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Mikael Elfman

Researcher

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Radiation detector resolution over a continuous energy range

Author

  • Yanwen Zhang
  • Brian D. Milbrath
  • William J. Weber
  • Mikael Elfman
  • Harry J Whitlow

Summary, in English

An ion approach is demonstrated to determine energy resolution in both semiconductor detectors and scintillators over a continuous energy range. For semiconductors, the energy resolution of a silicon detector was measured as a function of helium ion energy, and the values from extrapolation to high energies are in good agreement with the literature data from alpha measurements. For scintillators, benchmark crystals subject to He+ irradiation were investigated, and the agreement of energy resolution between the ion and gamma measurements indicates that the ion approach can be used to predict the energy resolution of the candidate materials in thin-film form or small crystals when large crystals necessary for gamma-ray measurements are unavailable.

Department/s

  • Nuclear physics

Publishing year

2007

Language

English

Publication/Series

Applied Physics Letters

Volume

91

Issue

9

Document type

Journal article

Publisher

American Institute of Physics (AIP)

Topic

  • Subatomic Physics

Status

Published

ISBN/ISSN/Other

  • ISSN: 0003-6951