The browser you are using is not supported by this website. All versions of Internet Explorer are no longer supported, either by us or Microsoft (read more here: https://www.microsoft.com/en-us/microsoft-365/windows/end-of-ie-support).

Please use a modern browser to fully experience our website, such as the newest versions of Edge, Chrome, Firefox or Safari etc.

Johan Rathsman by the sea

Johan Rathsman

Senior lecturer

Johan Rathsman by the sea

2 breaking effects in 2-loop RG evolution of 2HDM

Author

  • Joel Oredsson
  • Johan Rathsman

Summary, in English


We investigate the effects of a ℤ
2
symmetry in the CP-conserving Two-Higgs-Doublet-Model (2HDM); which is often imposed to prevent Flavor-Changing-Neutral-Currents (FCNCs) at tree-level. Specifically, we analyze how a breaking of the ℤ
2
symmetry spreads during renormalization group evolution; employing general 2-loop renormalization group equations that we have derived. Evolving the model from the electroweak to the Planck scale, we find that while the case of an exact ℤ
2
symmetric 2HDM is very constrained, a soft breaking of the ℤ
2
symmetry extends the valid parameter space regions. The effects of a hard ℤ
2
breaking in the scalar sector as well as the stability of the flavor alignment ansatz are also investigated. We find that while a hard breaking of the ℤ
2
symmetry in the potential is problematic, since it speeds up the growth of quartic couplings, the generated FCNCs are heavily suppressed. Conversely, we also find that hard ℤ
2
breaking in the Yukawa sector at most gives moderate ℤ
2
breaking in the potential; whereas the FCNCs can become quite sizable far away from the ℤ
2
symmetric regions.

Department/s

  • Theoretical Particle Physics - Has been reorganised

Publishing year

2019-02-22

Language

English

Publication/Series

Journal of High Energy Physics

Volume

2019

Issue

2

Document type

Journal article

Publisher

Springer

Topic

  • Subatomic Physics

Keywords

  • Beyond Standard Model
  • Higgs Physics

Status

Published

ISBN/ISSN/Other

  • ISSN: 1029-8479